These systems are used to evaluate the electrical performance of semiconductor and electronic devices, etc.,under temperature and humidity stress or high and low temperature Cycle  .

Evaluation System enables continuous measurement of resistance changes under temperature and humidity stress or  
high and low temperature Cycle or under .

Automatic measurement, data storage and processing are operated systematically with a PC.

Graphic display of data, compatibility with spreadsheet software, dataprocessing via LAN, are some of the features for
realizing accurate and effective contact reliability evaluation.